AUTO-CORRECTION AND DESIGN-FOR-TESTABILITY IN EMBEDDED MEASUREMENT SYSTEMS |
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| Uwe Frühauf, Ernst-Georg Kranz, Hellmut Leuterer |
- Abstract:
- For investigation and training of students in the field of high resolution measurement technology was built an embedded measurement system with 16 bit resolution and additional modules for self-diagnostics and utocorrection, including methods of design-for-testability in analogue circuits.
- Keywords:
- Embedded measurement system, autocorrection, Design-for-testability, analogue Boundary-Scan, evaluation system
- Download:
- IMEKO-TC4-2002-120.pdf
- DOI:
- -