AN APPLICATION OF TCRBF NEURAL NETWORK IN MULTI-NODE FAULT DIAGNOSIS METHOD
Zbigniew Czaja, Michal Kowalewski
Abstract:
This paper presents the new self-testing method for diagnosis of analog parts in mixed-signal embedded systems controlled by microcontrollers. The tested analog part is stimulated by a sinus-wave supplied by the onboard generator and its responses are sampled in selected nodes by microcontrollers ADC. The measurement space is represented by differences between values of selected node voltages. Fault detection and localization is performed by a Two-Center Radial Basis Function (TCRBF) Neural Network. The diagnosis procedure was implemented and simulated in a PC.
Keywords:
fault diagnosis, neural network, BIST
Download:
IMEKO-WC-2009-TC4-340.pdf
DOI:
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Event details
Event name:
XIX IMEKO World Congress
Title:

Fundamental and Applied Metrology

Place:
Lisbon, PORTUGAL
Time:
06 September 2009 - 11 September 2009
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